
Document Number: 38-05537 Rev. *M Page 30 of 33
Acronyms Document Conventions
Units of Measure
Acronym Description
BGA ball grid array
CE
chip enable
CEN
clock enable
CMOS complementary metal oxide semiconductor
EIA electronic industries alliance
FBGA fine-pitch ball grid array
I/O input/output
JEDEC joint electron devices engineering council
JTAG joint test action group
LSB least significant bit
MSB most significant bit
NoBL No Bus Latency
OE
output enable
SRAM static random access memory
TAP test access port
TCK test clock
TDI test data-in
TDO test data-out
TMS test mode select
TQFP thin quad flat pack
TTL transistor-transistor logic
WE
write enable
Symbol Unit of Measure
°C degree Celsius
MHz megahertz
µA microampere
mA milliampere
mm millimeter
ms millisecond
mV millivolt
ns nanosecond
ohm
% percent
pF picofarad
Vvolt
Wwatt
Kommentare zu diesen Handbüchern